03 Aug

Electron Microscopy Conference (EMC) 2016.

Posted by Etienne

Serma Technologies will be attending the Electron Microscopy Conference (EMC) to be held August 28 – September 2, 2016 in Lyon, France.

Karine Rousseau, Senior Technical Expert, will be joining the event and will present the poster “Finding defects in global methodology to assess GaN reliability from defect localization to failure mechanism: study case on GaN HEMTs structure” during this week. This poster focuses on failure analyses of AlGaN/GaN technologies. Some complete tracking methods have been developed for these AlGaN/GaN HEMTs structures: 3D Slice and View and Transmission Electron Microscopy (TEM) analyses with advanced TEM lamellae preparation and TEM imaging with chemical analysis (EDS, EELS). The degradation of AlGaN/GaN HEMTs is investigated, defects identified and contamination elements localized.

Since 2004, this European Conference is covering all kinds of microscopy and not only electron microscopy. All techniques, from optics to electronic, receive then a wonderful audience according to the increasing number of delegates participating to this major event, from the European microscopy community but also from outside Europe, making the EMC series a true actor in microscopy at the world scale. http://emc2016.fr/en.